Probe calibration by using a different type of probe as a reference in GTEM cell above 1GHz
スポンサーリンク
概要
- 論文の詳細を見る
Calibration of an electric field probe using a different type and size of probe as a reference is carried out in a GTEM cell from 1 to 6GHz. We compared our results with those of calibration in an anechoic chamber to determine the effectiveness of the calibration. The difference between the calibration factors of the GTEM cell and the anechoic chamber increases when the probe is calibrated in an area in which the electric field distribution is nonuniform. Therefore, it is important to place the probe in an area with good uniformity or maintain the uniformity of the electric field in the GTEM cell when calibrating electric field probes with different dimensions.
著者
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Ishigami Shinobu
EMC Group, National Institute of Information and Communication Technology
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Ishigami Shinobu
EMC Group, National Institute of Information and Communications Technology
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Matsumoto Yasushi
EMC Group, National Institute of Information and Communication Technology
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Wu Ifong
EMC Group, National Institute of Information and Communication Technology
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Gotoh Kaoru
EMC Group, National Institute of Information and Communication Technology
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Gotoh Kaoru
EMC Group, National Institute of Information and Communications Technology
関連論文
- Probe calibration by using a different type of probe as a reference in GTEM cell above 1GHz
- Basic analysis of large quasi-TEM waveguides using dipole frequency selective surface for EMC testing
- Calibration of electric field probes with three orthogonal elements by standard field method