Calibration of electric field probes with three orthogonal elements by standard field method
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概要
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Electric field probes with three orthogonal elements were calibrated from 1-6GHz by the standard field method in an anechoic chamber. A special jig was constructed for setting and calibrating a Δ-beam-type probe. Calibration factors of the probes were obtained for each element using this jig. To reflect the future revision of IEC 61000-4 series, uncertainty in the calibration factors was investigated to improve calibration quality and determine the factors affecting calibration. We found that fluctuation in the power transmitted from a high power amplifier and the imperfection of the anechoic chamber were the most important factors affecting uncertainty.
著者
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Ishigami Shinobu
EMC Group, National Institute of Information and Communication Technology
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Matsumoto Yasushi
EMC Group, National Institute of Information and Communication Technology
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Wu Ifong
EMC Group, National Institute of Information and Communication Technology
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Gotoh Kaoru
EMC Group, National Institute of Information and Communication Technology
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