On the Effect of Scheduling in Test Generation
スポンサーリンク
概要
- 論文の詳細を見る
The order of faults which are targeted for test-pattern generation affects both of the processing time for test generation and the number of generated test-patterns. This order is referred to as a test generation schedule. In this paper, we consider the effect of scheduling in test generation. We formulate the test generation scheduling problem which minimizes the cost of testing. We propose schedulings based on test-pattern generation time, dominating probability and dominated probability, and analyze the effect of these schedulings. In the analysis, we show that the total test-pattern generation time and the total number of test-patterns can be reduced by the scheduling according to the descending order of dominating probability prior to the ascending order of test-pattern generation. This is confirmed by the experiments using ISCAS'85 benchmark circuits. Further, in the experiments, we consider eight schedulings, and show that the scheduling according to the ascending order of dominated probability is the most effective of them.
- 社団法人電子情報通信学会の論文
- 1996-08-20
社団法人電子情報通信学会 | 論文
- 福井大におけるCWジャイロトロンの開発(電子管と真空ナノエレクトロニクス及びその評価技術)
- 適応的拡散制御を伴うパーティクルフィルタを用いた頭部姿勢推定システム(顔・身体動作認識, 画像の認識・理解論文)
- 複数の計算量仮定を組み込んだメタ帰着技法による安全性解析 : ElGamal暗号の場合
- A-7-29 パスワードベース認証付き鍵交換の安全性における(不)可能性(A-7. 情報セキュリティ,一般セッション)
- 多重リング構造のk-out-of-n署名の修正提案(情報通信基礎サブソサイエティ合同研究会)