電子・電子同時計測における制御システムの開発

概要

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We have developed a system controlling over an electron-electron coincidence spectrometer consisting of two hemispherical analyzers, an x-ray source, and an electron gun. It has been confirmed, by measuring x-ray- and electron-excited Auger-electron spectra and x-ray photoelectron spectra, that this control system works reliably. Using the system, a distribution curve, leading to an Auger-photoelectron coincidence spectrum, has been measured for the time intervals between an Auger-electron and a photoelectron in Auger-photoelectron pairs, at the L3WAuger and 2p3/2 photoelectron peaks in nickel.
群馬大学教育学部の論文