120101 ピエゾ(高分子系)フィルムを用いたひずみゲージの試作と静ひずみ測定法(OS03 実験力学的手法とその応用1,オーガナイズド・セッション)

概要

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This study proposes the method for the strain analysis using marketed the ultra-high impedance contact type surface potential voltmeter newly developed. The piezoelectric polymer film sheet (Polyvinylidene fluoride, PVDF) was cut down in the rectangle, and the strain gages can be obtained one directional strain components. The experiments are carried out using potential volts meter and developed piezo film strain gages. As a result of the experiments, following conclusions are as follow. (1) Voltage can be measured stable using the ultra-high impedance contact type surface potential voltmeter, at the surface of piezo film gages. (2) The result of strain distribution of beam theory and resistance wire strain gages are obtained to be equivalent the voltage distribution of piezo film measured in 3-point bending and 4 point bending test of the double end support beam.
2011-03-17