表面の半球反射率と垂直放射率の同時測定のための広波長域高速ふく射スペクトル測定装置の開発(熱工学,内燃機関,動力など)

概要

論文の詳細を見る
A new spectrophotometer system is developed for the study of thermal radiation characteristics of surfaces in thermal engineering environments. The system measures spectra of normal-incidence hemispherical reflectance R_<NH> and normal emittance ε_N in a near-ultraviolet through infrared region of wavelength of 0.30〜11μm simultaneously and repeatedly with a cycle time of 4s. The system enables us to evaluate the normal-incidence absorptance A_N in this wide spectral region. Spectrum transition of specular-finished and rough-finished nickel surfaces in a high-temperature air-oxidation process is measured to demonstrate the performance of the system. Clear interference behaviors are found even in the spectra of hemispherical reflectance R_<NH> and emittance ε_N of the rough-finished surface.
社団法人日本機械学会の論文
2009-06-25