Room-temperature tensile creep of a PZT wafer in short and open-circuit conditions

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概要

• 論文の詳細を見る

• A commercially available soft lead titanate zirconate (PZT) wafer that is poled in thickness direction is subjected to various magnitudes of constant longitudinal tensile stress. The evolutions of electric displacement in thickness direction and longitudinal strain over time are measured. The measured total responses are divided into linear responses, immediate switching-induced responses, and creep responses. It is found that immediate switching-induced responses can be described by stress power functions and creep responses by stress and time power laws, within the current range of tensile stress.

• 社団法人日本セラミックス協会の論文
• 2008-01-01

著者

• KIM Sang-Joo

  Department of Metallurgical Engineering, Seoul National University

• LEE SOO-IL

  Department of Anesthesiology and Pain Medicine, Dong-A University Medical Center and Medicine Colleg

• Kim Sang-joo

  Department Of Mechanical And Information Engineering University Of Seoul

• Lee Soo-il

  Department Of Anesthesiology And Pain Medicine Dong-a University Medical Center And Medicine College

• LEE Chang-Hoan

  Korea Institute of Science and Technology Information

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