3次元画像計測における投影光のしま強度配列の最適化 : モンテカルロシミュレーションの適用

概要

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The pattern projection technique is one of the powerful methods in the 3-D image measurement. It is demanded that differences of the intensities between adjacent addresses should be large in order to assign the addresses correctly. In this paper the arrangement of the stripe strength in each address is optimized by two methods of the Monte-Carlo simulation ; one is the Metropolis method and the other the multi-canonical method. We study not only the case of the monochromatic light but also the case of the color that ensures more precise identification of the addresses. For the both cases, much better results than the former treatment are obtained by the Metropolis method within shorter computation times. Furthermore, the simulation by the multi-canonical method gives even better results though the calculation time becomes about twenty times longer. It is considered that the latter results are almost the optimized solutions.
福岡工業大学の論文
2006-09-30