Goodness-of-Fit Tests for the Type-I Extreme-Value and Two-Parameter Weibull Distributions with Unknown Parameters Estimated by Graphical Plotting Techniques ------ Part 1:Critical Values

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概要

• 論文の詳細を見る
• 宇宙航空研究開発機構の論文

著者

• Liao Min

  Northwestern Polytechnical University Xi'an P.r. China

• SHIMOKAWA Toshiyuki

  National Aerospace Laboratory

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