Secondary Ion Emission from a C_<60> Film Bombarded by Fast Heavy Ions(Atomic and molecular physics)
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概要
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Secondary ion emission from a C_<60>-film target was investigated using fast projectile ions of ^7Li, ^<12>C, ^<16>O, and ^<28>Si in an energy range from 50 to 300 keV/amu. The measurements were performed by means of time-of-flight mass spectrometry. We observed a variety of fullerene-like ions of C^+_<60±2k> and C_<60>-multiples like C^+_<120±2k>. The emission yields of these ions were investigated in terms of the electronic stopping power S_e=(dE/dx)_e to find an appropriate scaling formula. To achieve more accurate scaling formulation, we employed the effective energy deposition derived from a spatial distribution function of energy deposition available in literature. The experimental emission yields have been successfully accounted for by this newly developed quantity.
- 2006-10-15
著者
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Itoh Akio
Department of Nuclear Engineering, Kyoto University
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Itoh Akio
Department Of Nuclear Engineering Kyoto University:quantum Science And Engineering Center Kyoto Univ
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Itoh Akio
Department Of Agricultural Policy Division Of Social Environment Graduate School Of Environmental Sc
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Yogo Akifumi
Department Of Nuclear Engineering Kyoto University:(present Adress) Advanced Photon Research Center
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