蛍光X線分析法を用いた金属表面の微量分析
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概要
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X-ray fluorescence spectrometry (XRF) is widely used as a simple, convenient and non-destructive microanalysis method for solids, powders and solutions. XRF was employed to quantitatively examine small amounts of contaminant elements, e.g. C and Cr, on the surface of metallic materials. By minimizing the matrix effect it is found that XRF is useful in analyzing elements on a metallic surface, which consists of about 10 elements. The detection limit was of the order of 1×10^<-2> mass %.
- 久留米工業大学の論文
- 2005-08-30
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