Ballistic Electron Emission Microscopy (BEEM) and Spectroscopy of Buried Semiconductor Heterostructures and Quantum Dots(STM-BEEM interfaces)

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概要

• 論文の詳細を見る

• BEEM is a powerful, new low energy electron microscopy for imaging and spectroscopy of buried quantum objects and nondestructive local characterization of buried semiconductor heterostructures. We will present several applications : 1) Imaging and spectroscopy of 300Å InAs islands confined by GaAs potential barriers 2) Local conduction band offsets of GaSb self assembled quantum dots in GaAs 3) Spatial probing of the order-disorder transition in GaInP/GaAs heterostructures 4) Imaging of misfit dislocations at the InGaAs/GaAs interface buried 600Å below the surface 5) Conduction band structure of GaNballistic electron emission microscopysemiconductor heterostructurequantum dotsband offsetInAsGaAsGaSbGaN

• 東北大学の論文
• 1997-03-31

著者

• Narayanamurti Venkatesh

  Department Of Electrical & Computer Engineering University Of California

関連論文

• Ballistic Electron Emission Microscopy (BEEM) and Spectroscopy of Buried Semiconductor Heterostructures and Quantum Dots(STM-BEEM interfaces)

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