New Technique for the Thermal Resistance Measurement of Power Field Effect Transistors Using Cathodoluminescence

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概要

著者

KIM Hwa-Mok
Quantum-functional Semiconductor Research Center, Dongguk University
Kim Hwa-mok
Quantum-functional Semiconductor Research Center Dongguk University
OH Jae-Eung
Center for Electronic Materials & Components, Department of Electrical Engineering, Hanyang Universi
YOON Jin-Sik
Center for Electronic Materials and Components, School of Electrical and Computer Engineering, Honya
LEE Seung-Ho
Center for Electronic Materials and Components, School of Electrical and Computer Engineering, Honya
LEE Won-Sang
LG Corporate Institute of Technology
CHUN Kye-Ik
LG Corporate Institute of Technology
CHUNG Ki-Woong
LG Corporate Institute of Technology
CHUNG Hae-Won
Agency for Defence Development
KANG Tae-Won
Quantum-Functional Semiconductor Research Center, Dongguk University
Oh Jae-eung
Center For Electronic Materials And Components School Of Electrical And Computer Engineering Honyang
Kang Tae-won
Quantum-functional Semiconductor Research Center Dongguk University
Yoon Jin-sik
Center For Electronic Materials And Components School Of Electrical And Computer Engineering Honyang
Lee W‐s
Lg Electronics Inst. Technol. Seoul Kor
Lee Seung-ho
Center For Electronic Materials And Components School Of Electrical And Computer Engineering Honyang

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