Partial Disorder of the Si(111)6×6-Au Surface Studied by Scanning Tunneling Microscopy : Surfaces, Interfaces, and Films

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概要

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• Scanning tunneling microscopy (STM) is used to investigate a 6×6 surface phase of the Au/Si(111) interface. Results show that no well-ordered structure is present on this surface. Instead, two ordered and one disordered 6×6 sublattices are observed to be formed in the distance scale of 500Å. A kinematical calculation of the diffraction patterns is carried out taking into account the difference in sublattice order. The calculation reproduces the main features of the reported electron-diffraction patterns well. The comparison of these results with those of previous structural studies is discussed.

• 社団法人応用物理学会の論文
• 2001-12-15

著者

• EGAMI Akihiro

  Institute of Physics, University of Tsukuba

• Hosoi Shinya

  Institute of Physics, University of Tsukuba

• HIGASHIYAMA Kazuyuki

  Institute of Physics,University of Tsukuba

• Suzuki Kazushi

  Institute Of Physics University Of Tsukuba

• Hosoi Shinya

  Institute Of Physics University Of Tsukuba

• Egami Akihiro

  Institute Of Physics University Of Tsukuba

• Higashiyama Kazuyuki

  Institute Of Physics University Of Tsukuba

関連論文

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• Optical Spectra of Y_3Fe_5O_(YIG) in the Y^ 4p Core Excitation Region
• Reflection and Photoemission Studies of Neutron-Irradiated Graphite
• Partial Disorder of the Si(111)6×6-Au Surface Studied by Scanning Tunneling Microscopy : Surfaces, Interfaces, and Films

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