233 Bystander Effect in p53 Expression Using X-ray Capillary Microbeam(Micro-beam irradiation, Abstracts of the 46th Annual Meeting of the Japan Radiation Research Society)

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概要

• 論文の詳細を見る
• 日本放射線影響学会の論文
• 2003-12-15

著者

• Ito Atsushi

  Sch. Eng. Tokai Univ.

• Funayama Kenya

  Sch. Engineering Tokai Univ.

• Hiyama Shin

  Sch. Engineering Tokai Univ.

• Ito Atsushi

  Sch. Engineering Tokai Univ.

関連論文

• 198 LET dependence of Oxidative DNA Damage Induced by Heavy Ions under Hypoxic Condition(Physics, chemistry and DNA damage, Abstracts of the 46th Annual Meeting of the Japan Radiation Research Society)
• Detection of Oxidative DNA Damage Induced by Heavy Ions at NIRS-HIMAC
• 233 Bystander Effect in p53 Expression Using X-ray Capillary Microbeam(Micro-beam irradiation, Abstracts of the 46th Annual Meeting of the Japan Radiation Research Society)

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