Electrical Resistivity of C-15 Compounds Zr_<1-x>Ta_xV_2
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概要
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The ZrV_2 compound shows resistivity anomalies in the range between 70 and 120 K when it is annealed at 1050 and 920℃, while the anomalies do not appear when it is annealed at 800℃ and as-cast. Comparison between X-ray diffraction patterns at 77 and 300 K suggests that these anomalies are caused by structural transformation. Resistivity measurements of Z_<1-x<Ta_xV_2 compounds which are annealed at l050℃ show that similar anomalies to those for ZrV_2 appear in Zr_<0.95≷Ta_<0.05>V_2, while no anomalies appear in Ta-rich compounds with x>__-0.10. The low temperature results of Zr_<1-x<Ta_xV_2 conform well with the T^3 law of the Wilson theory. The high temperature results of these compounds, on the other hand, show a deviation from the linear T behavior predicted by this theory. The phenomenological expression based on the saturation model conforms well to the high temperature results.
- 社団法人応用物理学会の論文
- 1981-12-05
著者
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Oota Akio
Department Of Electrical Engineering And Electronics Toyohashi University Of Technology
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Oota Akio
School Of Electrical Engineering And Electronics Toyohashi University Of Technology
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Oota A
Toyohashi University Of Technology
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NOGUCHI Seiichiro
School of Electrical Engineering and Electronics, Toyohashi University of Technology
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KAMATANI Yasuhiro
Department of Electrical Engineering and Electronics, Toyohashi University of Technology
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KAMATANI Yasuhiro
School of Electrical Engineering and Electronics, Toyohashi University of Technology
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Kamatani Yasuhiro
Department Of Electrical Engineering And Electronics Toyohashi University Of Technology
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Noguchi Seiichiro
Department Of Electrical Engineering And Electronics Toyohashi University Of Technology
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Noguchi Seiichiro
School Of Electrical Engineering And Electronics Toyohashi University Of Technology
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