Comparison of Various Parameterization Models for Optical Functions of Amorphous Materials : Application for Sputtered Titanium Dioxide Thin Films

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2000-01-15

著者

• Hong J

  Kaist Taejeon Kor

• Lee Soonil

  Department Of Molecular Science And Technology Ajou University

• HONG Junegie

  Laboratoire des Plasmas et des Couches Minces, IMN-CNRS-Universite de nantes

関連論文

• Spectro-ellipsometric Studies of Amorphization and Thermal Annealing in Ion-implanted Silicon
• Comparison of Various Parameterization Models for Optical Functions of Amorphous Materials : Application for Sputtered Titanium Dioxide Thin Films
• In Situ Ellipsometry Studies of ZnS Thin Film Growth
• Real-time Ellipsometry Studies of Gold Thin-Film Growth
• In Situ Ellipsometry Studies of ZnS Thin Film Growth
• Comparison of Various Parameterization Models for Optical Functions of Amorphous Materials: Application for Sputtered Titanium Dioxide Thin Films

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