Reduction of Surface Recombination in InGaAs/InP Heterostructures Using UV-Irradiation and Ozone
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-02-28
著者
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Lu Zheng-hong
Institute For Microstructural Sciences National Research Council Of Canada
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Mcalister Sean
Institute For Microstructural Sciences National Research Council Of Canada
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Mckinnon William
Institute For Microstructural Sciences National Research Council Of Canada
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DRIAD Rachid
Institute for Microstructural Sciences, National Research Council of Canada
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LAFRAMBOISE Sylvain
Institute for Microstructural Sciences, National Research Council of Canada
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SCANSEN Donald
Institute for Microstructural Sciences, National Research Council of Canada
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Driad Rachid
Institute For Microstructural Sciences National Research Council Of Canada
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Scansen Donald
Institute For Microstructural Sciences National Research Council Of Canada
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Laframboise Sylvain
Institute For Microstructural Sciences National Research Council Of Canada
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Lu Zhneg-Hong
Institute for Microstructural Sciences, National Research Council of Canada
関連論文
- Reduction of Surface Recombination in InGaAs/InP Heterostructures Using UV-Irradiation and Ozone
- Improved Stress Reliability of Analog TiHfO Metal–Insulator–Metal Capacitors Using High-Work-Function Electrode