Effect of Stacking Faults on Carrier Generation in a Silicon Depletion Layer
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1978-12-05
著者
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Matsuoka Yutaka
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Ikuta Kenji
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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NAKAJIMA Shigeru
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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Nakajima Shigeru
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
関連論文
- Effect of Stacking Faults on Carrier Generation in a Silicon Depletion Layer
- Electrical Characterization of Micro Defects in Silicon Crystal : C-3: CRYSTAL TECHNOLOGY