Soft Error Analysis of Fully Static MOS RAM : A-2: LSI-1

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1983-02-28

著者

• Anami Kenji

  Lsi Research & Development Laboratory

• Yoshihara Tsutomu

  Lsi Research & Development Laboratory

• Shinohara Hirofumi

  Lsi Research & Development Laboratory

• Yoshimoto Masahiko

  Lsi Research & Development Laboratory

• Hirata Yoshihiro

  Lsi Research & Development Laboratory

• Nakano Takao

  Lsi Research And Development Laboratory

• Nakano Takao

  Lsi Research & Development Laboratory

• Nakano Takao

  Lsi Research & Development Lab.

関連論文

• New Dynamic RAM Cell Combined with Hi-C Structure : A-2: LSI-1
• Soft Error Analysis of Fully Static MOS RAM : A-2: LSI-1
• Diffusion Length Measurement Using Dynamic MOS RAM : A-3: LSI-2
• Hot-Electron Trapping Effects of Short Channel 64 K Dynamic MOS RAM : A-2: LSI-1

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