Transient Phenomenon of Twin Formation in Quartz Plates

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概要

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• The transient characteristics of x-axis inversion for AT-cut quartz plates were studied. The resonance frequency of the quartz plate was monitored throughout the thermal treatment process for x-axis inversion. The x-axis inversion can be detected by resonance frequency change. It was observed that the critical temperature, T_c, for the x-axis inversion decreases with the film thickness deposited on the quartz plate. An expansion phenomenon of the x-axis inverted area was observed at temperatures higher than T_c. Degeneration of resonance frequencies corresponding to AT-cut and -35°15' rotated Y-cut was observed above 553℃.

• 社団法人応用物理学会の論文
• 1997-05-30

著者

• UNO Takehiko

  Kanagawa Inst. Tech.

• Uno Takehiko

  Kanagawa Institute Of Technology

関連論文

• Observation of Stimulated Emission in Short Wavelength Band from Silica-Based Superstructure Films
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• P1-10 Growth Techniques of Single Crystal Thin Films on SiO_2 Substrates(Poster session 1)
• P1-17 Fundamental Study on Shear Mode Type Solidly Mounted Resonator(Poster session 1)
• Acoustic Wave Devices Using Artificial Twin Quartz Plates
• Piezoelectricity in Poled Ge-Doped Silica Thin Films (Short Note)
• P1-9 Dependence of Physical Properties on Dopants in Superstructure Films(Poster session 1)

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