Investigation of Defects in High-Resistivity Undoped CdTe Using the EBIC Method

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1986-09-20

著者

• Wada Morio

  Yokogawa Electric Corporation

• Wada Morio

  Yokogawa Hokushin Electric Corporation

• Wada Morio

  Yokogawa Electric Co.

• SUZUKI Junichi

  Yokogawa Hokushin Electric Corporation

• HOSOMATSU Haruo

  Yokogawa Hokushin Electric Corporation

• Suzuki Junichi

  Yokogawa Electric Corporation

関連論文

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• InP optical switches operating in 2 nanoseconds and their applications for optical packet networks and optical routers (レーザ・量子エレクトロニクス)
• InP optical switches operating in 2 nanoseconds and their applications for optical packet networks and optical routers (光エレクトロニクス)
• BCS-1-8 InP Optical Switches and their applications for Optical Packet Networks and Optical Routers
• BCS-1-8 InP Optical Switches and their applications for Optical Packet Networks and Optical Routers
• Investigation of Defects in High-Resistivity Undoped CdTe Using the EBIC Method
• Photoluminescence and Photoemission Studies of Defects in InP Induced by Zn Diffusion
• Development of InGaAs photodiodes for near-infrared spectroscopy
• Characterization of Te Precipitates in CdTe Crystals : Condensed Matter

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