Characterization of Te Precipitates in CdTe Crystals : Condensed Matter
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概要
- 論文の詳細を見る
Te precipitates in CdTe crystals grown by the Bridgman method have been investigated using Auger electron spectroscopy, transmission infrared microscopy and etching techniques. The transmission infrared microscopy shows that Te precipitates with dimensions of several micrometers have well-defined crystallographic facets and are found to decorate dislocations; the density of the precipitates (< 1 μm in diameter) is of the same order of the etch pit density, which suggests there exists a strong correlation between the presence of the precipitates and the dislocations.
- 社団法人応用物理学会の論文
- 1988-06-20
著者
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Wada Morio
Yokogawa Electric Corporation
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Wada Morio
Yokogawa Electric Co.
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Suzuki Junichi
Yokogawa Electric Corporation
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