Surface Extended Energy Loss Fine Structure (EELFS) above Cr L_<2,3> Edge

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概要

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• The oscillations of extended energy loss fine structure (EELFS) have been clearly observed above the L_<2,3> edge of polycrystalline Cr in the reflection mode with a conventional CMA electron analyser. The spectrum and the result of its Fourier analysis have been very similar to the previous results of extended X-ray-edge energy loss fine structure analysis. The observed Cr spacing 2.51 Å by this EELFS analysis is very close to the Cr bulk spacing (2.50 Å).

• 社団法人応用物理学会の論文
• 1986-09-20

著者

• Ishida Tadashi

  Government Industrial Research Institute

• Ishida T

  Government Industrial Research Institute

関連論文

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• Extended Appearance-Potential Fine-Structure Analysis of Fe(110) Surface
• Surface Extended Energy Loss Fine Structure (EELFS) above Cr L_ Edge
• Probability Computer Method of Determining the Lattice Parameters from Powder Difraction Data

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