Subharmonic Gap Structure Observed in a Series Array of Thin-Film Josephson Junctions
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概要
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The subharmonic gap structure was observed as a striking conductance depression effect in a series array of eleven Josephson junctions. Each element is a type of short superconducting weak-link comprising microshorts in an oxide layer sandwiched between two niobium film electrodes. The experimental observation implied that the ac Josephson effect significantly raised the strong structure at the voltage: V=N2Δ/ne, where N is a cascade number (N=11), and the integer n means the n-th subharmonic gap structure.
- 社団法人応用物理学会の論文
- 1986-08-20
著者
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Matsui Toshiaki
Radio Research Laboratory Ministry Of Posts And Telecommunications
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Hayashi Risao
Radio Research Laboratory Ministry Of Posts And Telecommunications
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OHTA Hiroshi
The Institute of Physical and Chemical Research
関連論文
- A Voltage Bias Method for Studying the AC Josephson Effect at High Frequencies and for Application to Mixers
- Subharmonic Gap Structure Observed in a Series Array of Thin-Film Josephson Junctions