Profile Controlled Etching for Mo/WSi_x Double Layers
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1986-02-20
著者
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Suzuki Masamitsu
Ntt Atsugi Electrical Communications Laboratories
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KURIYAMA Yoichi
NTT Atsugi Electrical Communications Laboratories
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HIRAYAMA Masahiro
NTT Atsugi Electrical Communications Laboratories
関連論文
- Profile Controlled Etching for Mo/WSi_x Double Layers
- Scanning Tunneling Microscopy of Cleaved Si and GaAs Surfaces in Air
- Decrease in Electrical Resistivity of W Films on GaAs Substrates after High-Temperature Annealing