High Temperature Operated Enhancement-Type β-SiC MOSFET : Silicon Devices and Process Technologies(<Special Section>Solid State Devices and Materials 1)
スポンサーリンク
概要
- 論文の詳細を見る
Enhancement-type β-SiC MOSFETs have been fabricated on a single crystalline β-SiC layer grown on a 3-inch Si (100) substrate by chemical vapor deposition. The MOSFETs fabricated by applying the reactive ion etching technique show reasonable I-V characteristics at room temperature. The saturation tendency of the drain currents has been observed at a drain voltage as high as 18 V. The MOSFETs operate even at 350℃.
- 社団法人応用物理学会の論文
- 1988-11-20
著者
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Fuma Hiroo
Toyota Central Research & Development Labs. Inc.
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MIURA Atsushi
Toyota Central Research & Development Labs., Inc.
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TADANO Hirohsi
Toyota Central Research & Development Labs., Inc.
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SUGIYAMA Sususmu
Toyota Central Research & Development Labs., Inc.
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TAKIGAWA Mitsuharu
Toyota Central Research & Development Labs., Inc.
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Takigawa M
Toyota Central Research & Development Labs. Inc.
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Sugiyama Sususmu
Toyota Central Research & Development Labs. Inc.
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Tadano Hirohsi
Toyota Central Research & Development Labs. Inc.
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Miura Atsushi
Toyota Central R&d Labs. Inc.
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- High Temperature Operated Enhancement-Type β-SiC MOSFET : Silicon Devices and Process Technologies(Solid State Devices and Materials 1)
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