Non-Optical Shear-Force Detection for Scanning Near-Field Optical Microscope

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概要

• 論文の詳細を見る

• A non-optical shear-force detection method for use with a scanning near-field optical microscope (SNOM) is proposed. Electrodes on a piezoelectric bimorph are designed so that one part is used for vibrating the scanning probe and the other for detecting the vibration. This provides a very compact actuator-detector pair without any need for optical alignment. Comparison with conventional laser detection shows good correlation for a probe approach curve. A simple method of analyzing the lock-in detected signal for quick and convenient examination of the resonance of the probe is demonstrated.

• 社団法人応用物理学会の論文
• 1997-06-15

著者

• Miyano Kenjiro

  Department Of Applied Physics The University Of Tokyo

• Miyano Kenjiro

  Department Of Applied Physics Faculty Of Engineering University Of Tokyo

• TAMARU Hiroharu

  Department of Applied Physics, The University of Tokyo

• Tamaru Hiroharu

  Department Of Applied Physics The University Of Tokyo

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• Non-Optical Shear-Force Detection for Scanning Near-Field Optical Microscope

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