New Method for the Spectral Radiance Factor Measurement of Diffuse Reflective Substrates
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概要
- 論文の詳細を見る
We propose and demonstrate a new practical method for measuring the total/diffuse hemispherical reflectances and simultaneously reflected radiance factor of diffuse reflective substrates. This method involves the use of a collimated and focused monochromatic light beam and a specified integrating-sphere detector. The reflected radiance factor can be computed from the differential of the reflectance as a function of the polar angle.
- 社団法人応用物理学会の論文
- 1997-03-01
著者
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SHIMOKAWA Ryuichi
Electrotechnical Laboratory
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IGARI Sanekazu
Japan Quality Assurance Organization (JQA)
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Igari S
Japan Quality Assurance Organization (jqa) Tokyo Jpn
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SAITO Ichiro
Electrotechnical Laboratory
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