Direct Observation of Developed Plastic Deformation and Its Application to Nondestructive Testing
スポンサーリンク
概要
- 論文の詳細を見る
A band pattern representing what we believe to be a developed, localized plastic deformation has been discovered in a fringe system formed by electronic speckle-pattern interferometry. Time historical tracing of this pattern enables us to predict the location and timing of material fracture before any other visible indication appears. Application of this observation to nondestructive testing is discussed.
- 社団法人応用物理学会の論文
- 1996-07-01
著者
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Faizal A.
Research And Development Center For Applied Physics Indonesian Institute Of Sciences
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YOSHIDA Sanichiro
Research and Development Center for Applied Physics, Indonesian Institute of Sciences
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SUPRAPEDI RINI
Research and Development Center for Applied Physics, Indonesian Institute of Sciences
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MARINCAN Pardede
Research and Development Center for Applied Physics, Indonesian Institute of Sciences
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SEPTRIYANTI Hutagalong
Research and Development Center for Applied Physics, Indonesian Institute of Sciences
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JULINDA S.
Research and Development Center for Applied Physics, Indonesian Institute of Sciences
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ANUNG Kusnowo
Research and Development Center for Applied Physics, Indonesian Institute of Sciences
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Yoshida Sanichiro
Research And Development Center For Applied Physics Indonesian Institute Of Sciences
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Julinda S.
Research And Development Center For Applied Physics Indonesian Institute Of Sciences
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Kusnowo Anung
Research Laboratory Of Precision Machinery And Electronics Tokyo Institute Of Technology
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Anung Kusnowo
Research And Development Center For Applied Physics Indonesian Institute Of Sciences
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Suprapedi Rini
Research And Development Center For Applied Physics Indonesian Institute Of Sciences
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Marincan Pardede
Research And Development Center For Applied Physics Indonesian Institute Of Sciences
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Septriyanti Hutagalong
Research And Development Center For Applied Physics Indonesian Institute Of Sciences
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Rini Widiastuti
Research and Development Center for Applied Physics, Indonesian Institute of Sciences
関連論文
- Development of a Frequency-Offset-Locked He-Xe Laser at 3.51 μm
- Direct Observation of Developed Plastic Deformation and Its Application to Nondestructive Testing