The Form Change of Metal Thin Film as Measured by the Retracted X-Ray Fluorescence (RXF) Method

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概要

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• The refracted X-ray fluorescence (RXF) method can measure the form change of evaporated Mn thin film. The Mn thin film was changed from rough island thin film to flat island thin film by evaporated Au atoms. In this letter, we reportthat the RXF method is effective as a method of studying surfaces and interfaces.

• 社団法人応用物理学会の論文
• 1991-04-15

著者

• Sasaki Yuji

  Department Of Analytical Science Institute For Materials Resarch Tohoku Univetsity

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