Temperature Profiles in Etched-Well Surface-Emitting Semiconductor Lasers
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概要
- 論文の詳細を見る
Radial distributions of temperature profiles in the active layer of etched-well vertical-cavity surface-emitting lasers are determined using a new comprehensive two-dimensional thermal model featuring realistic distribution of heat sources. Self-consistency between electrical and thermal processes is achieved. Importance of two-dimensional current- and heat-spreading is demonstrated.
- 社団法人応用物理学会の論文
- 1991-04-01
著者
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Osinski Marek
Center For High Technology Materials University Of New Mexico:department Of Electrical And Computer
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Nakwaski Wlodzimierz
Center for High Technology Materials, University of New Mexico
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Nakwaski Wlodzimierz
Center For High Technology Materials University Of New Mexico:the Institute Of Physics Technical Uni
関連論文
- Temperature Profiles in Etched-Well Surface-Emitting Semiconductor Lasers
- Multimode Small-Signal Analysis of Side-Mode Injection-Locked Semiconductor Lasers