Cavitational Failure Phenomenon in Pb-Sn Eutectic Solders
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概要
- 論文の詳細を見る
This report concerns mechanisms on the formation of r-type crack (or cavitation) associated with grain boundary sliding in Pb-Sn eutectic solders used for microelectronic applications. The experimental works indicate that cavitation takes place in a specimen deformed in a tensile test at a relatively low strain rate of 7×10^<-6>/s and in specimens fatigued at 0.1% to 0.2% strain range and a frequency of 1.67×10^<-2>/s. Based on these phenomenological observations, it is discussed that the presence of cavities requires large sliding displacements combined with a high stresses.
- 社団法人応用物理学会の論文
- 1995-11-01
著者
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Lee S‐m
Samsung Electronics Co. Ltd. Suwon Kor
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Lee Seong-min
Memory Product And Tecnology Memory Devision Semiconductor Samsung Electronics Co. Ltd.
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Lee Seong-min
Memory Division Semiconductor Samsung Electronics Co. Ltd.
関連論文
- Fracture Strength Measurement of Silicon Chips
- Cavitational Failure Phenomenon in Pb-Sn Eutectic Solders
- Fracture Strength Measurement of Silicon Chips