In Situ Annealing of Melt-Grown ZnSe Crystals under Zn Partial Pressure
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概要
- 論文の詳細を見る
Zinc selenide crystals are grown from the melt by a modified Bridgman method under argon pressure. A specific Zn partial pressure over the melt is maintained during growth by heating Zn in a reservoir. Grown crystals are annealed in situ in a crucible under Zn partial pressure. The annealed crystals exhibit n-type conduction. Electrical properties of the annealed crystals are affected by annealing temperature and Zn reservoir temperature. Low-resistivity crystals have a resistivity of 0.3 to 3 Ω・cm. The electron mobility is 260 to 560 cm^2/V・s at room temperature. The electron mobility of the annealed crystals is also dependent on the Zn reservoir temperature during growth.
- 社団法人応用物理学会の論文
- 1992-05-01
著者
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Matsuo Masatoshi
Department Of Cardiology Saiseikai Fukuoka General Hospital
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Matsuo Masatoshi
Department Of Electrical And Electronic Engineering Faculty Of Engineering Ibaraki University:(prese
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Komuro Toyokazu
Department Of Electrical And Electronic Engineering Faculty Of Engineering Ibaraki University
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KIKUTA Isao
Department of Electrical and Electronic Engineering, Faculty of Engineering, Ibaraki University
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Kikuta Isao
Department Of Electrical And Electronic Engineering Faculty Of Engineering Ibaraki University
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