Current-Pressure Characteristics of Ar Field Ion Source at High Pressures

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概要

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• The ion current characteristic of an Ar field ionization source as a function of pressure has been studied using a W tip. The characteristic at low pressures shows a linear relationship, while at high pressures it shows an anisotropic change. A Field Ionization Microscopy image in the latter case shows an extremely localized emission on {110} planes, which suggests the origin of the unusual characteristic at high pressures.

• 社団法人応用物理学会の論文
• 1992-03-01

著者

• Sato Mieko

  Electrotechnical Laboratory

• Sato Mieko

  Electrotechical Laboratory

関連論文

• FEM Observation of NO Adsorption on Tungsten
• FEM Study of Low-Temperature Adsorption of NO on Tungsten
• FEM Study of Low-Temperature Adsorption of Mixture of N_2 and O_2 on Tungsten
• Current-Pressure Characteristics of Ar Field Ion Source at High Pressures
• Field Emission Microscope Images of Oxygen Adsorption on Tungsten at 300 K and at Higher Coverages
• Patterns Around the (110) Plane of Field Emission Microscope Images of Tungsten Tips

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