Influence of Lattice Mismatch on the Electrical and Structural Properties of HgCdTe Epilayers
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-12-30
著者
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Sugiura Lisa
Research And Development Center Toshiba Corporation
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SHIGENAKA Keitaro
Research and Development Center, Toshiba Corporation
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NAKATA Fumio
Research and Development Center, Toshiba Corporation
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HIRAHARA Keijiro
Research and Development Center, Toshiba Corporation
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Nakata Fumio
Research And Development Center Toshiba Corporation
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Hirahara Keijiro
Research And Development Center Toshiba Corporation
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Shigenaka Keitaro
Research And Development Center Toshiba Corporation
関連論文
- Influence of Lattice Mismatch on the Electrical and Structural Properties of HgCdTe Epilayers
- Confirmation of P-Type Conduction in Li-Doped ZnSe Layers Grown on GaAs Substrates