Probing the DX Center in GaAs and Related Alloys by Capacitance Transient Measurements under Stress
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-01-01
著者
-
Yu Peter
Department Of Physics And Materials Science City University Of Hong Kong
-
Yu Peter
Department Of Physics University Of California Berkeley : Materials Science Division Lawrence Berkel
-
Li Ming-fu
Center For Optoelectronics Department Of Electrical Engineering National University Of Singapore
-
Yu Peter
Department Of Applied Biology & Chemical Technology Hong Kong Polytechnic University
関連論文
- Zebrafish embryos for studying radiation response in vivo
- Probing the DX Center in GaAs and Related Alloys by Capacitance Transient Measurements under Stress
- Hydrostatic Pressure Dependence of Eg-100 meV Photoluminescence Emissions in n-Type AlGaAs
- 香港近海のフグとその毒性に関する予備的研究