Growth of Low Dislocation Density GaSb Single Crystals by Czochralski Method
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1982-06-20
著者
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Obokata Takeshi
Fujitsu Laboratories Ltd.
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HIRAI Iesada
Fujitsu Laboratories, Ltd.
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Hirai Iesada
Fujitsu Laboratories Ltd.
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OBOKATA Takeshi
Fujitsu Laboratories, Ltd.
関連論文
- Growth of Low Dislocation Density GaSb Single Crystals by Czochralski Method
- Simple Method of Measuring Cubic Anisotropy Constant in [111]-Oriented Garnet Films with a Torque Magnetometer
- Electron Spin Resonance of Oxygen-Nitrogen Complex in Silicon