Optimum Thickness of Magnetic Layer for Short-Wavelength Magnetic Recording
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-11-15
著者
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KITAORI Noriyuki
Kao Corporation, Recording and Imaging Science Laboratories
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YOSHIDA Osamu
Kao Corporation, Recording and Imaging Science Laboratories
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Kitaori Noriyuki
Kao Corporation Recording And Imaging Science Laboratories
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MIZUNOYA Hirohide
Kao Corporation, Recording and Imaging Science Laboratories
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Mizunoya Hirohide
Kao Corporation Recording And Imaging Science Laboratories
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Yoshida Osamu
Kao Corporation Recording And Imaging Science Laboratories
関連論文
- Changes in Raman Spectra with Deposition Conditions and Plasma Treatment of Diamond Like Carbon Thin Films
- Analysis of Columnar Microstructure in Fe-N Thin Films Prepared by an Ion-Assisted Vapor Deposition Method
- The Application of a Carbon Protective Layer to Metal Evaporated Tape
- Control of Surface Oxidation Layer Thickness in Metal Evaporated Tapes
- Optimum Thickness of Magnetic Layer for Short-Wavelength Magnetic Recording
- Changes in Raman Spectra with Deposition Conditions and Plasma Treatment of Diamond Like Carbon Thin Films