Measurements of the Off-Angle of Crystal Surface and the Refractive Index of Crystal for X-rays by the X-ray Two-Incidence Surface Method
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概要
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A new convenient diffraction measurement technique is proposed, which enables us to measure exactly the off-angle β of a crystal surface and the refracstive index for X-rays n. When X-rays which are Bragg-reflected by the first crystal enter the second crystal (sample) through the surface and the side at the same time, both X-rays propagate in the crystal in slightly different directions because of the refraction effect. Therefore, the rocking curve which is measured by rotating the second crystal around tlte axis perpendicular to the incident plane has double peaks. From the angle between the two peaks, β and n of the crystal can be estimated. The applicability of the proposed method to GaAs (100) surfaces with β=0, 2 and 3° is demonstrated.
- 社団法人応用物理学会の論文
- 1996-08-15
著者
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Maehama T
Univ. Ryukyus Okinawa Jpn
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Maehama Takehiro
Department Of Electrical And Electronic Engineering Faculty Of Engineering University Of The Rykyus
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Afuso Chushin
Department of Electrical and Electronics Engineering, University of the Ryukyus
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Afuso C
Univ. Ryukyus Okinawa Jpn
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Afuso Chushin
Department Of Electrical And Electronic Engineering Faculty Of Engineering University Of The Ryukyus
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