Applications of Aluminium Nitride Films Deposited by Reactive Sputtering to Silicon-On-Insulator Materials
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-08-15
著者
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Bengtsson Stefan
Department Of Solid State Electronics Chalmers University Of Technology
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BERGH Mats
Department of Solid State Electronics, Chalmers University of Technology
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CHOUMAS Manolis
Department of Solid State Electronics, Chalmers University of Technology
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OLESEN Christian
Department of Solid State Electronics, Chalmers University of Technology
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JEPPSON Kjell
Department of Solid State Electronics, Chalmers University of Technology
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Bergh Mats
Department Of Solid State Electronics Chalmers University Of Technology
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Jeppson Kjell
Department Of Solid State Electronics Chalmers University Of Technology
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Choumas Manolis
Department Of Solid State Electronics Chalmers University Of Technology
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Olesen Christian
Department Of Solid State Electronics Chalmers University Of Technology
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BENGTSSON Stefan
Department of Solid State Electronics, Chalmers University of Technology
関連論文
- Applications of Aluminium Nitride Films Deposited by Reactive Sputtering to Silicon-On-Insulator Materials
- Electrical Methods for Characterizing Directly Bonded Silicon/Silicon Interfaces