Influence of Dopants on Characteristics of X-Ray Detectors Fabricated from Indium-, Gallium-, and Chlorine-Doped Cadmium Telluride Single Crystals
スポンサーリンク
概要
- 論文の詳細を見る
Counting characteristics of X-ray detectors fabricated from indium-doped, gallium-doped, and chlorine-doped CdTe have been investigated. The detectors fabricated from indium-doped and gallium-doped crystals showed radiation-induced polarization, namely, a progressive decrease of count rate with an increase of photon fluence in the high-photon-fluence region, while the detectors fabricated from chlorine-doped crystals did not. Results from current-voltage characteristics of the detectors indicated that the different counting characteristics of these detectors originated from the difference in internal electric fields in each detector.
- 社団法人応用物理学会の論文
- 1995-08-15
著者
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Sato Kenji
Central R&D Laboratoy, Japan Energy Corporation
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Kanamori Hitoshi
Kyoto Institute Of Technology
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Ishida Shinichiro
Central Research Laboratory Shimadsu Corporation
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SATO Toshiyuki
Central Research Laboratory, Shimadsu Corporation
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UKITA Masaaki
Central Research Laboratory, Shimadsu Corporation
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YAMADA Masayoshi
Kyoto Institute of Technology
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Ukita Masaaki
Central Research Laboratory Shimadsu Corporation
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Sato Toshiyuki
Central Research Laboratory Shimadsu Corporation
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Sato Kenji
Central R&d Laboratoy Japan Energy Corporation
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Sato Kenji
Central Research Laboratory Shimadsu Corporation
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- Influence of Dopants on Characteristics of X-Ray Detectors Fabricated from Indium-, Gallium-, and Chlorine-Doped Cadmium Telluride Single Crystals
- Correction of a Spectral Image Formed Incoherently by a Plane-Grating Monochromator by Means of Optical Transfer Functions