An Improved Method for Determination of Surface Charge Distribution of Weak Spurious Modes in Quartz Plates
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概要
- 論文の詳細を見る
The method described here accurately determines the two-dimensional surface charge pattern of a weak mode existing in the vicinity of a strong mode in quartz crystal plate using an equivalent model that suitably approximates the surface charge frequency characteristics in the target modes measured at each measurement coordinate. The surface charge frequency characteristics are measured by an automated measurement system based on the electrical probe method. The temperature characteristics of the measured surface charge pattern of a weak mode near the fundamental thickness-shear mode in a rectangular AT-cut plate demonstrated that even for a weak mode, the present procedure provides patterns clearer than those obtained with a previous technique.
- 社団法人応用物理学会の論文
- 1995-01-15
著者
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Sekimoto Hitoshi
Department Of Electronics And Information Engineering Faculty Of Technology Tokyo Metropolitan Unive
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Sekimoto Hitoshi
Department Of Bio-productive Science Faculty Of Agriculture Utsunomiya University
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Watanabe Y
Tokyo Univ. Agriculture Tokyo Jpn
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Watanabe Yasuaki
Department Of Chemistry School Of Science And Engineering Waseda University
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Oomura Yoshimasa
Department of Electronics and Information Engineering, Faculty of Technology, Tokyo Metropolitan Uni
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Oomura Y
Tokyo Metropolitan Univ. Tokyo Jpn
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