Shot Noise in Back-Biased Step Junctions with Exponential Carrier Generation Rate
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概要
- 論文の詳細を見る
A theory of noise due to carrier generation in the space charge region of one-sided abrupt junctions with exponentially graded generation rate is presented. Assuming that the generation rate is expressed as C_0 exp (-x/a) and the noise spectrum as S(ω) = 2qIΓ^2, we find that the noise reduction factor Γ^2 lies between 0.68 and 1, depending upon the ratio of the characteristic length, a, to the width of the space charge region.
- 社団法人応用物理学会の論文
- 1991-01-15
著者
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SATO Kazunori
Department of Homeostasis Medicine and Nephrology, Graduate School, Tokyo Medical and Dental Univers
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Sasaki Kazuhiro
Department Of Electronics Faculty Of Engineering Tokai University
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Sasaki Kazuhiro
Department Of Electronics Faculty Of Engineering
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Sato Kazunori
Department Of Computational Nanomaterials Design Nanoscience And Nanotechnology Center The Institute
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Sasaki Kazuhiro
Department of Bio-science, Central Research Institute of Electric Power Industry
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SATO Kazunori
Department of Biology, Faculty of Science, Kyushu University
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