Conduction Current Relaxation of Inhomogeneous Conductor III

概要

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The conditions in which the conducting path structure simulates the low-frequency dielectric relaxation of oxide glass were investigated on the basis of considerations of the ratio of the initial and steady-state currents, the relation between the magnitude of the relaxation and the potential energy, and a numerical calculation using an approximation. Conclusions are as follows: (1) The shape of the conducting path is complicated. (2) The intensity of the local field at the steady state is distributed exponentially and its ratio of the maximum to the minimum is large. (3) It is expected that the conducting path structure of the interconnected structure type simulates the low-frequency dielectric relaxation of oxide glass.
社団法人応用物理学会の論文
1992-11-15