Correlation between Crystal Perfection and Reflection Intensity of Analyzer Crystal for X-Ray Spectra

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概要

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• Using a triple spectrometer arrangement, the crystal perfection is assessed for a-quartz and ADP each in two different forms: the as-received analyzer crystal form and chemically polished form. Both chemically polished crystals are proved to be more perfect than those in their received condition. Then, the reflection intensities for the two forms are compared for the respective crystals, using a commercial X-ray fluorescence unit. The results depend on the X-ray wave-lengths. While the peak height for the as-received crystals is higher than that for the chemically polished ones for short wavelengths, the reverse is true for long wavelengths. This finding and the other results are discussed in term of the theoretical integrated intensity, the peak shape, the collimator condition, and the X-ray absorption effect through the fragmented surface layer assumed here.

• 社団法人応用物理学会の論文
• 1978-04-05

著者

• Takiguchi Toshimichi

  National Chemical Laboratory For Industry

• ASADA Eiichi

  National Chemical Laboratory for Industry

関連論文

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