Inhomogeneous Oxygen Precipitation and Stacking Fault Formation in Czochralski Silicon

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1978-11-05

著者

• Inoue Naohisa

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• Inoue Naohisa

  Musashino Electrical Communication Laboratory Nippon Tel

• Oosaka Jiro

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

関連論文

• Magnetic Loss and Bubble Dynamics in (Y, Eu, Sm)_3(Ga, Fe)_5O_ System
• Hard-Bubble Free Garnet Films in (Y, Eu)_3(Ga, Fe)_5O_ System
• Stacking Faults from Oxide Precipitates in CZ Silicon : B-3: CRYSTAL GROWTH AND DEFECTS
• Growth of Stacking Faults by Bardeen-Herring Mechanism in Czochralski Silicon
• Inhomogeneous Oxygen Precipitation and Stacking Fault Formation in Czochralski Silicon

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