Influence of Lattice Defects in Single Crystal on Characteristics of Silicon-Vidicon
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1969-07-05
著者
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Kubo Shuji
Matsushita Research Institute Tokyo Inc.
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Naito Hiroyuki
Matsushita Research Institute Tokyo Inc.
関連論文
- Effects of Preoxidation Treatment on MOS Transistor Characteristics
- C-V Characteristics of Heat-Treated Si-SiO_2 Interface
- Influence of Lattice Defects in Single Crystal on Characteristics of Silicon-Vidicon