Construction of a New Type X-ray Diffraction Camera for High Pressure Studies and Its Application to the Measurement of Compressibility of β-SiC
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概要
- 論文の詳細を見る
This report contains a new apparatus for x-ray diffraction study at very high pressure and the measurement of compressibility of β-SiC. The x-ray camera is based on a Debye-Scherrer type geometry and Mo K_α radiation is used. The point is that the x-ray tube and camera are oscillated synchronously around the pressurized sample. This is useful for obtaining clearer diffraction pattern and for doing single crystal analysis at very high pressure. Using the apparatus, the effect of pressure up to 170kbars was measured on the lattice parameter of β-SiC. The determind compressibility K=4.8×10^<-7>/bar of β-SiC showed no significant influence of pressure. From this result, Grunneisen's constant γ=0.78 was calculated.
- 社団法人応用物理学会の論文
- 1969-06-05
著者
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Ozaki Yoshiharu
Research Laboratory Of Engineering Materials Tokyo Institute Of Technology
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Saito Shinroku
Research Laboratory Of Engineering Materials Tokyo Institute Of Technology
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