Characteristic Properties of Si {311} Surfaces
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1968-06-05
著者
-
Sasaki Isao
Central Research Laboratory Tokyo Shibaura (toshiba) Electric Co. Ltd.
-
Hara Hisashi
Central Research Laboratory Tokyo Sibaura (toshiba) Electric Co.
-
Sato Tai
Central Research Laboratory Tokyo Sibaura (toshiba) Electric Co.
-
Takeishi Yoshiyuki
Central Research Laboratory, Tokyo Sibaura (TOSHIBA) Electric Co.
-
Takeishi Yoshiyuki
Central Research Laboratory Tokyo Sibaura (toshiba) Electric Co.
-
Takeishi Yoshiyuki
Central Research Laboratory Tokyo Shibaura Electric Co. Ltd.
関連論文
- Effects of Crystallographic Orientation on Mobility, Surface State Density, and Noise in p-Type Inversion Layers on Oxidized Silicon Surfaces
- Characteristic Properties of Si {311} Surfaces
- Ejection of Electrons from Barium Oxide by Noble Gas Ions